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Some participants (eg 8) have systems designed for solid samples with specimen changers that cannot handle a thin film. Consequently in some cases the specimen was mounted with the film above the plane of diffraction. One way of overcoming this problem is to mount the specimen upside down so that the coating is only just above the diffraction plane. This slide shows the effect on intensity and displacement when the specimen is measured on both sides. It does show that displacement is resolved but with a massive reduction in intensity.